Marchionna, Stefano and Virtuani, Alessandro and Acciarri, Maurizio and Isella, Giovanni and von Känel, Hans (2006) Defect imaging of SiGe strain relaxed buffers grown by LEPECVD. Materials Science in Semiconductor Processing, 9 (4). pp. 802-805. ISSN 1369-8001
Full text not available from this repository.Abstract
We compare four different selective etching solutions commonly used to highlight threading dislocations (TD), in SiGe hetero-epitaxial layers. The aim is to identify, amongst the many reported in the literature, an etching solution effective over the whole Ge concentration range. Etching experiments have been performed on Si1−xGex linearly graded relaxed buffer layers with a final germanium concentration x varying from x=0.2 to 0.9. All samples have been deposited on Si(100) by low-energy plasma-enhanced chemical vapour deposition (LEPECVD). The experimental results show that a variant of the so-called Schimmel-etch is successful in revealing TD over the Ge concentration range investigated.
| Item Type: | Scientific journal article, Newspaper article or Magazine article |
|---|---|
| Subjects: | Physical sciences > Materials science Physical sciences > Physics |
| Department/unit: | Dipartimento ambiente costruzioni e design > Istituto sostenibilità applicata all'ambiente costruito |
| Depositing User: | Alessandro Virtuani |
| Date Deposited: | 18 Jul 2013 13:56 |
| Last Modified: | 18 May 2016 06:49 |
| URI: | http://repository.supsi.ch/id/eprint/2560 |
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