Mihaylov, B. and Bowers, J.W. and Betts, T.R. and Gottschalg, R and Krametz, T. and Leidl, R. and Berger, K.A. and Zamini, S. and Dekker, Nico and Graditi, Giorgio and Roca, F. and Pellegrino, Michele and Flaminio, Giovanni and Pugliatti, P.M. and Di Stefano, F and Hoffmann, S. and Koehl, M. and Gerber, A. and NOll, J. and Paletta, F. and Friesen, Gabriele and Dittmann, Sebastian
Results of the SOPHIA module intercomparison part-1: STC, low irradiance conditions and temperature coefficients measurements of c-Si technologies.
In: 29th EUPVSEC, Amsterdam.