Pastorino, Matteo and Salvadé, Andrea and Monleone, Ricardo and Randazzo, Andrea (2006) A New Microwave Axial Tomograph for the Inspection of Dielectric Materials. In: Presentation at IEEE International Workshop on Imaging Systems and Techniques IST2006, 19 April 2006, Minori, Italy.
Full text not available from this repository.Abstract
In this paper, the development of a microwave axial tomograph for the inspection of dielectric materials is discussed. In particular, hardware and software solutions are pointed out. An experimental bistatic imaging setup is described. Moreover, the results of several forward-scattering simulations, which are aimed at defining suitable working conditions, are reported. Finally, to invert the collected field-scattered data, a deterministic inexact Newton method is applied. The approach is evaluated by using synthetic data, and the results of a preliminary experimental reconstruction are reported.
| Item Type: | Article in conference proceedings or Presentation at a conference (Paper) |
|---|---|
| Subjects: | Engineering > Electronic & electrical engineering |
| Department/unit: | Dipartimento tecnologie innovative > Istituto sistemi e elettronica applicata > Laboratorio telecom telemetria e alta frequenza |
| Depositing User: | Dina Gomes Dias |
| Date Deposited: | 19 Sep 2014 13:38 |
| Last Modified: | 14 Sep 2023 17:00 |
| URI: | http://repository.supsi.ch/id/eprint/5260 |
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