A method for the detection and quantitative estimation of low shunt resistances via the dark spectral response measurement of multi-junction PV cells: theory and results

Pravettoni, Mauro and Müllejans, Harald (2011) A method for the detection and quantitative estimation of low shunt resistances via the dark spectral response measurement of multi-junction PV cells: theory and results. In: Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE The 37th IEEE Photovoltaic Specialists Conference, 19-24 Jun 2011, Seattle.

Full text not available from this repository.

Abstract

This paper shows how to experimentally detect a low shunt resistance in a component cell of a multijunction photovoltaic (PV) device and theoretically estimate its value, by means of measurements of the dark spectral response (DRS). The theoretical approach to DSR measurements on 2-junction devices is revised, starting from the simplest approach where the device is modelled by a series of two non-ideal diodes. The quantitative modelling results are compared with the DSR measurement of an a-Si:H/uc-Si thin-film mini-module. Examples of the same theoretical analysis on 3-junction devices are also given, together with experimental results for comparison.

Actions (login required)

View Item View Item