Electrical characterization of multi-junction thin-film photovoltaic modules: spectral mismatch correction to standard conditions and comparison with outdoor measurements

Pravettoni, Mauro and Tzamalis, Georgios and Anika, Komlan and Polverini, Davide and Müllejans, Harald (2010) Electrical characterization of multi-junction thin-film photovoltaic modules: spectral mismatch correction to standard conditions and comparison with outdoor measurements. In: Wang, Qi and Yan, Baojie and Higashi, Seiichiro and Tsai, Chuang-Chuang and Flewitt, Andrew, (eds.) Symposium A – Amorphous and Polycrystalline Thin-Film Silicon Science and Technology. MRS Proceedings, 1245 . Materials Research Society 2010.

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Abstract

Multi-junction thin-film devices have emerged as very promising PV materials due to reduced cost, manufacturing ease, efficiency and long term performance. The consequent growing interest of the PV community has lead to the development of new methods for the correction of indoor measurements to standard test conditions (STC), as presented in this paper. The experimental setup for spectral response measurement of multi-junction large-area thin-film modules is presented. A method for reliable corrections of indoor current-voltage characterization to STC is presented: results are compared with outdoor measurements where irradiance conditions are close to standard ones, highlighting ongoing challenges in standard characterization of such devices.

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